Standarde de calibrare SEM

Light Element EDS Spectrometer Calibration Standard/Stub with Faraday Cup

EDS Calibration Standard N°5

Five materials – Stainless steel (SRM 1155), SiO2, Mn, B and C mounted and polished in a standard 12.7 mm pin stub. In the center of the stub is a 3.05 mm copper 200 µm aperture to serve as Cu/Al reference, as well as a Faraday cup.

Can be mounted on these SEM brands:
FEI, Tescan, Hitachi, Camscan, Jeol, Phenom, ZEISS

[EN]

Light Element EDS Calibration Standard/Stub with Image Size Reference

EDS Calibration Standard N°6

Five materials – Stainless steel (SRM 1155), SiO2, Mn, B and C mounted and polished in a standard 12.7 mm pin stub. In the centre of the stub is a 3.05 mm copper 200 mesh grid to serve as Cu/Al reference, as well as image size reference.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

Backscattered Electron Detector Calibration Standard/Stub

BSD Calibration Standard N°7

Five materials – Au, Nb, Ge, Si and C; mounted and polished in a standard 12.7 mm pin stub. In the centre of the stub is a 3.05 mm copper 200 µm aperture to serve as Cu/Al reference, as well as a Faraday cup. Calibration standard for GSR software.

Can be mounted on these SEM brands:
FEI, GSR, Hitachi, Jeol, Tescan, ZEISS

EDS Spectrometer Calibration Standard/Stub with Faraday Cage

EDS Calibration Standard N°8

Five materials – Stainless steel (SRM 1155), SiO2, Mn, BN and C mounted and polished in a standard 12.7 mm pin stub. In the centre of the stub is a 3.05 mm copper 200 µm aperture to serve as Cu/Al reference, as well as a Faraday cup.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

W/Si fusion – Z contrast vs X-ray contrast sample + Faraday Cage

EDS Calibration Standard N°9

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

Back Scattered Electron Calibration Standard/Stub – 10 Standards with Faraday Cage

BSD Calibration Standard N°10

Ten materials – Bi, Ir, Ho, Sn, Nb, Ge, Co, Ti, Si, C; mounted and polished in a standard 12.7 mm pin stub. In the centre of the stub is a 3.05 mm copper 200 µm aperture to serve as Cu/Al reference, as well as a Faraday cup.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

Ta/Si fusion – Z contrast vs X-ray contrast sample + Faraday Cage

EDS Calibration Standard N°11

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

SECS Light-element Calibration Standard/Stub

EDS Calibration Standard N°12 

Five materials – CaB6, SiC, CrN, Fe2O3, CaF2; mounted in a 12.7 mm pin stub with 200 µm Cu aperture.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

EDAX TEX Calibration Standard/Stub

EDAX Calibration Standard N°13

Five materials Fe, Ni, Cr, Mo, Si, 12.7 mm stainless steel stub, 200 µm Cu aperture.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

EDAX LEX/TEX Calibration Standard/Stub

EDAX Calibration Standard N°14

Five materials BN, Cu, Mo, SiO2, C, 12.7 mm aluminium stub, 200 µm Cu aperture.

Can be mounted on these SEM brands:
EDAX, FEI, Hitachi, Jeol, Tescan, ZEISS

microValidator Calibration Standard/stub

microValidator Calibration Standard N°15

MLA microValidator calibration standard. 8 materials Ge, Nb, Au, C, Si, SS316, Mn, SiO2, 200 µm Cu aperture.

microValidator Calibration Standard/Stub

microValidator Calibration Standard N°16

GSR / General microValidator calibration standard. Eight materials Ge, Nb, Au, C, Si, SS316, Mn, SiO2, 200 µm and 600 µm Cu aperture, tin balls, mounted on 8-hole GSR-type relocatable mount.

EDX Calibration Standard/Stub

Calibration Standard N°17

Six materials B, C, CaCO₃, Ti, Mn, Cu, 12.7 mm aluminium stub, 200 µm Cu aperture.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

Phenom Calibration Standard

Phenom Calibration Standard N° 20

For Phenom desktop SEM.

Notes: 1) CDMS-1T Pelco magnification calibration standard 2) Glassy carbon 3) SiO2 fused silica 4) Manganese 5) NBS SRM 1155 ANSI 316 SS 6) Gold 7) CaF2 natural fluorite 8) Tin balls Aluminium stub with light carbon coating

EDX Calibration Standard/Stub

Calibration Standard N°21

Six materials – BN, CaCO₃, PTFE, Ti, Mn, SS316; mounted on a 12.7 mm aluminium stub, 200 µm Cu aperture.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

EDX Calibration Standard/Stub

Calibration Standard N°22

Six materials – C, Si, Co, Ge, Rh, Au; mounted on a 12.7 mm aluminium stub, 200 µm Cu aperture.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Oxford, Tescan, ZEISS

Metals

Metals standards for quantitative microanalysis

36 metal standards plus Faraday Cup. Mounted and polished in a 1″ (25.4 mm) diameter SS303 block – 9 mm high. Be, C, Al, Si, Ti, V, Cr, Mn, Fe, Co, Ni, Sb, Cu, Zn, Ge, Se, Sc, Y, Zr, Mo, Nb, Sn, Ru, Rh, Pd, Ag, Te, Hf, Ta, W, Re, Os, Ir, Au, Bi, Pt

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

Rare Earths

Rare-earth standards for quantitative microanalysis

21 rare-earth standards including a Faraday Cup. Mounted and polished in a 1″ (25.4 mm) diameter SS303 block – 9 mm high. B, C, LaF₃, CeO₂, PrSi₂, NdSi₂, Sm, EuF₃, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Gd₃Ga₅O₁₂, Sc, Y, U, ThF₄

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS

Rare-earth metals standard

18 rare-earth standards including a Faraday Cup. Mounted and polished in a 1″ (25.4 mm) diameter SS303 block – 9 mm high.
C, LaF₃, CeO₂, Pr, Nd, Sm, EuF₃, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Sc, Y, U. Sensitive to air – must be stored under vacuum or inert gas.

Can be mounted on these SEM brands:
FEI, Hitachi, Jeol, Tescan, ZEISS